10.
Applying the logistic regression in electrical impedance tomography to analyze conductivity of the examined objects
Tomasz Rymarczyk, Edward Kozłowski, Paweł Tchórzewski, Grzegorz Kłosowski, Przemysław Adamkiewicz, Barba Di, Maria Mognaschi, Sławomir Wiak
International Journal of Applied Electromagnetics and Mechanics