Search for Author, Title, Keyword
RESEARCH PAPER
Reliability Evaluation of Lifting Machinery Electronic Equipment: A Progressive Framework from Testing, Data Analysis to Assessment
,
 
 
 
 
More details
Hide details
1
Jiangsu Normal University Kewen College, China
 
2
School of Information and Control Engineering, China University of Mining and Technology, China
 
3
Xuzhou Heavy Machinery Co., Ltd., China
 
 
Submission date: 2025-12-04
 
 
Final revision date: 2026-01-31
 
 
Acceptance date: 2026-03-01
 
 
Online publication date: 2026-03-05
 
 
Corresponding author
Yabin Yan Yan   

Jiangsu Normal University Kewen College, Xuzhou, China
 
 
 
KEYWORDS
TOPICS
ABSTRACT
Reliability of electronic equipment is critical for lifting machinery safety. Studies have primarily concentrated on electronic components with limited attention to holistic frameworks. This paper proposes a reliability evaluation methodology for electronic equipment, addressing key limitations in systematic frameworks and practical utility. First, accelerated life test (ALT) is designed according to Coffin-Manson model, amplifying environmental stress to degradation. Second, wavelet packet (WP) is employed to extract performance degradation trends, enhancing data quality for subsequent analysis. Third, a pseudo-lifetime estimation approach is developed based on autoregressive moving average (ARMA) and performance degradation trajectory. Weibull distribution model is then used for quantitative reliability analysis. Finally, reliability test and analysis of load moment limiter (LML) demonstrate that the methodology is efficient, precise, and practically implementable, thereby bridging the gap between academic research and field applications.
REFERENCES (43)
1.
Buffolo M, Favero D, Marcuzzi A, De Santi C, Meneghesso G, Zanoni E. Review and outlook on GaN and SiC power devices: industrial state-of-the-art, applications, and perspectives. IEEE Transactions on Electron Devices 2024; 71(3): 1344–1355. https://doi.org/10.1109/TED.20....
 
2.
Mazumder S K, Voss L F, Dowling K M, Conway A, Hall D, Kaplar R J. Overview of wide/ultrawide bandgap power semiconductor devices for distributed energy resources. IEEE Journal of Emerging and Selected Topics in Power Electronics 2023; 11(4): 3957–3982. https://doi.org/10.1109/JESTPE....
 
3.
Udabe A, Baraia-Etxaburu I, Diez D G. Gallium nitride power devices: a state of the art review. IEEE Access 2023; 11: 48628–48650. https://doi.org/10.1109/ACCESS....
 
4.
Lai W, Liu A, Wang Z, Shangguan M, Li H, Chen M, Yao R, Xiong Y. Study on lifetime modeling of IGBT modules considering electric frequency influence mechanism. IEEE Transactions on Device and Materials Reliability 2023; 23(3): 395–403. https://doi.org/10.1109/TDMR.2....
 
5.
Silva C, Reis G, Alzamora A, Paula H. Reliability analysis of IGBT modules of multilevel inverters operating in hostile mining environments. IEEE Transactions on Industry Applications 2025 ;61(4): 6798–6809. https://doi.org/10.1109/TIA.20....
 
6.
Shi Y, Liu J, Ai Y, Chen S, Pei C. Lifetime prediction method of the traction converter IGBT based on plastic strain energy density. IEEE Transactions on Transportation Electrification 2024; 10(1): 1286–1298. https://doi.org/10.1109/TTE.20....
 
7.
Lai W, Shangguan M, Shi J, Li H, Wu Y, Yao R, Wang H, Jing H, Li Y. Research on remaining lifetime evaluation for traction system IGBT devices of electric locomotives with different service mileage. IEEE Transactions on Power Electronics 2025; 40(4): 6020–6032. https://doi.org/10.1109/TPEL.2....
 
8.
Wang H, Ma J, Yang Y, Gong M, Wang Q. A review of system-in-package technologies: application and reliability of advanced packaging. Micromachines 2023; 14(6): 1149. https://doi.org/10.3390/mi1406....
 
9.
Guan Q, Hang C, Li S, Zhang X, Liu Y, Wang Z. Research progress on the solder joint reliability of electronics used in deep space exploration. Chinese Journal of Mechanical Engineering 2023; 36(2): 16–28. https://doi.org/10.1186/s10033....
 
10.
Qiu B, Luo D, Wang Y, Nie X. Failure analysis technology of military electronic package and relevant cases. Environmental Technology 2010; 30(5): 44–49. https://doi.org/10.3969/j.issn....
 
11.
Wang H, Blaabjerg F. Power electronics reliability: state of the art and outlook. IEEE Journal of Emerging and Selected Topics in Power Electronics 2021; 9(6): 6476–6493. https://doi.org/10.1109/JESTPE....
 
12.
Peyghami S, Blaabjerg F, Palensky P. Incorporating power electronic converters reliability into modern power system reliability analysis. IEEE Journal of Emerging and Selected Topics in Power Electronics 2021; 9(2): 1668–1681. https://doi.org/10.1109/JESTPE....
 
13.
Chen Y, Yang T, Wang Y. Reliability modeling of mutual DCFP considering failure physical dependency. Journal of Systems Engineering and Electronics 2023; 34(4): 1063–1073. https://doi.org/10.23919/JSEE.....
 
14.
Xu Q, Xu Y, Tu P, Zhao T, Wang P. Systematic reliability modeling and evaluation for on-board power systems of more electric aircrafts. IEEE Transactions on Power Systems 2019; 34(4): 3264–3273. https://doi.org/10.1109/TPWRS.....
 
15.
Rezaei A, Fathollahi A, Akbari E, Saki M. Reliability calculation improvement of electrolytic capacitor banks used in energy storage applications based on internal capacitor faults and degradation. IEEE Access 2024; 12: 13146–13164. https://doi.org/10.1109/ACCESS....
 
16.
Altamimi A, Jayaweera D. Reliability of power systems with climate change impacts on hierarchical levels of PV systems. Electric Power Systems Research 2021; 190: 106830. https://doi.org/10.1016/j.epsr....
 
17.
Kumar V, Singh K, Tripathi K. Reliability prediction methods for electronic devices: a state-of-the-art review. IETE Technical Review 2022; 39: 460–470. https://doi.org/10.1080/025646....
 
18.
Anusuya K, Vijayakumar K. Comparative study of component-level reliability approaches in power electronic components. In: Proceedings of the 3rd International Conference on Advancement in Electrical and Electronic Engineering (ICAEEE); 2024; Gazipur, Bangladesh: IEEE; 1–6. https://doi.org/10.1109/ICAEEE....
 
19.
Novak M, Sangwongwanich A, Blaabjerg F. Monte Carlo-based reliability estimation methods for power devices in power electronics systems. IEEE Open Journal of Power Electronics 2021; 2: 523–534. https://doi.org/10.1109/OJPEL.....
 
20.
Vermelin W, Lövberg A, Misiorny M, Eng M, Brinkfeldt K. Data-driven remaining useful life estimation of discrete power electronic devices. In: Proceedings of the 33rd European Safety and Reliability Conference (ESREL 2023); 2023; Southampton, UK; 2595–2602. https://doi.org/10.3850/978-98....
 
21.
Peyghami S, Wang Z, Blaabjerg F. A guideline for reliability prediction in power electronic converters. IEEE Transactions on Power Electronics 2020; 35(10): 10958–10968. https://doi.org/10.1109/TPEL.2....
 
22.
Tian W, Zha W, Lei H, Yang X. Research and analysis of reliability evaluation methods for automotive electronic components. In: Proceedings of the 25th International Conference on Electronic Packaging Technology (ICEPT); 2024; Tianjin, China: IEEE; 1–4. https://doi.org/10.1109/ICEPT6....
 
23.
Shahbazi M, Smith N A, Marzband M, Habib H U R. A reliability-optimized maximum power point tracking algorithm utilizing neural networks for long-term lifetime prediction for photovoltaic power converters. Energies 2023; 16: 6071. https://doi.org/10.3390/en1616....
 
24.
Wang Z, Ding Y, Han T, Xu Q, Yan H, Xie M. Adaptive attention-driven few-shot learning for robust fault diagnosis. IEEE Sensors Journal 2024; 24(16): 26034–26043. https://doi.org/10.1109/JSEN.2....
 
25.
Liu Z, Yang S, Suo B. Storage life prediction of high-voltage diodes based on improved artificial bee colony algorithm optimized LSTM-transformer framework. Electronics 2025; 14(15): 3030. https://doi.org/10.3390/electr....
 
26.
Aparicio-Téllez R, Garcia-Bosque M, Díez-Señorans G, Celma S. Oscillator selection strategies to optimize a physically unclonable function for IoT systems security. Sensors 2023; 23(9): 4410. https://doi.org/10.3390/s23094....
 
27.
Zhao S, Makis V, Chen S, Li Y. Health assessment method for electronic components subject to condition monitoring and hard failure. IEEE Transactions on Instrumentation and Measurement 2019; 68(1): 138–150. https://doi.org/10.1109/TIM.20....
 
28.
Wang, X, Su, X, Wang, J. Nonlinear doubly wiener constant-stress accelerated degradation nodel based on uncertainties and acceleration factor constant principle. Applied Sciences 2021; 11(19): 8968. https://doi.org/10.3390/app111....
 
29.
You D, Liu S, Li F, Liu H, Zhang Y. Reliability assessment method based on small sample accelerated life test data. Eksploatacja i Niezawodność – Maintenance and Reliability 2025; 27(1): 192170. https://doi.org/10.17531/ein/1....
 
30.
Bhargava C, Sharma P, Senthilkumar M, Padmanaban S, Leonowicz Z. Review of health prognostics and condition monitoring of electronic components. IEEE Access 2020; 8: 75163–75183. https://doi.org/10.1109/ACCESS....
 
31.
Zhao F, Yuan Y, Chen C, Xiao L. Temperature prediction for electromechanical equipment in open-pit coal mines under complex working conditions using wavelet packet decomposition and graph attention network. Eksploatacja i Niezawodność – Maintenance and Reliability 2025; 27(3): 197381. https://doi.org/10.17531/ein/1....
 
32.
Song R, Chen W, Wang Y, Du L, Wang P. Transformer aging diagnosis method based on Raman spectroscopy wavelet packet-SPCA feature extraction. IEEE Transactions on Instrumentation and Measurement 2023; 72: 1–8. https://doi.org/10.1109/TIM.20....
 
33.
Lu G, Wen X, He G, Yi X, Yan P. Early fault warning and identification in condition monitoring of bearing via wavelet packet decomposition coupled with graph. IEEE/ASME Transactions on Mechatronics 2022; 27(5): 3155–3164. https://doi.org/10.1109/TMECH.....
 
34.
Fang C, Chen Y, Deng X, Lin X, Han Y, Zheng J. Denoising method of machine tool vibration signal based on variational mode decomposition and Whale–Tabu optimization algorithm. Scientific Reports 2023; 13: 1505. https://doi.org/10.1038/s41598....
 
35.
Chen Y, Xia X, Zhou W, Zhang J, Teng X, Chen Y. Prediction of the Lithium-Ion battery remaining useful life based on EMD-ARMA. Journal of Electric Power 2021; 36(1): 43–50. https://doi.org/10.13357/j.dlx....
 
36.
Chen C, Wang C, Lu N, Jiang B, Xing Y. A data-driven predictive maintenance strategy based on accurate failure prognostics. Eksploatacja i Niezawodność – Maintenance and Reliability 2021; 23(2): 387–394. https://doi.org/10.17531/ein.2....
 
37.
Gonzalez-Rodriguez PS, Lozoya-Santos JdJ, Gonzalez-Hernandez H G, Felix-Herran L C, Tudon-Martinez J C. Challenges and opportunities for extending battery pack life using new algorithms and techniques for battery electric vehicles. World Electric Vehicle Journal 2025; 16(8): 442. https://doi.org/10.3390/wevj16....
 
38.
Patrizi G, Martiri L, Pievatolo A, Magrini A, Meccariello G, Cristaldi L, Nikiforova N D. A review of degradation models and remaining useful life prediction for testing design and predictive maintenance of lithium-ion batteries. Sensors 2024; 24(11): 3382. https://doi.org/10.3390/s24113....
 
39.
Ling H. Optimal designs of multiple step-stress accelerated life tests for one-shot devices with Weibull lifetime distributions. IEEE Transactions on Reliability 2025; 74(3): 3017–3027. https://doi.org/10.1109/TR.202....
 
40.
Wang J, Wu J, Zhang J, Zhang Q, Fang Y, Huang X. Remaining useful life prediction method by integrating two-phase accelerated degradation data and field information. IEEE Transactions on Instrumentation and Measurement 2024; 73: 1–17. https://doi.org/10.1109/TIM.20....
 
41.
Kolev K, Tanev A. Identifying batch problems in aircraft field reliability analysis. Aerospace Research in Bulgaria 2022; 34: 130–137. https://doi.org/10.3897/arb.v3....
 
42.
Gu Y, Shen Y, Yu D. Degradation reliability analysis based on TOPSIS model selection method. Journal of Shanghai Jiaotong University (Science) 2019; 24(3): 351–356. https://doi.org/10.1007/s12204....
 
43.
Zhang Y, Yu G, Wang L, Jiang N. Performance degradation data based NC rotary table reliability predictions using a single sample. Journal of Tsinghua University (Science and Technology) 2020; 60(4): 299–305. https://doi.org/10.16511/j.cnk....
 
eISSN:2956-3860
ISSN:1507-2711
Journals System - logo
Scroll to top