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A combined universal generating function and physics of failure Reliability Prediction Method for an LED driver
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China Aerospace Academy of Systems Science and Engineering, Beijing, 100048, P. R. China
School of Reliability and Systems Engineering, Beihang University, Beijing, PR China
Publication date: 2021-03-31
Eksploatacja i Niezawodność – Maintenance and Reliability 2021;23(1):74-83
  • The gap is bridged between the component level and the circuit system level.
  • A multi-phase model is established according to function processes of circuit.
  • A universal numerical approach is provided for predicting the lifetime of LED drivers.
The accurate and effective reliability prediction of light emitting diode (LED) drivers has emerged as a key issue in LED applications. However, previous studies have mainly focused on the reliability of electrolytic capacitors or other single components while ignoring circuit topology. In this study, universal generating function (UGF) and physics of failure (PoF) are integrated to predict the reliability of LED drivers. Utilizing PoF, lifetime data for each component are obtained. A system reliability model with multi-phase is established, and system reliability can be predicted using UGF. Illustrated by a two-channel LED driver, the beneficial effects of capacitors and MOSFETs for the reliability of LED drivers is verified. This study (i) provides a universal numerical approach to predict the lifetime of LED drivers considering circuit topology, (ii) enhances the modelling and reliability evaluation of circuits, and (iii) bridges the gap between component and circuit system levels.
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