Search for Author, Title, Keyword
Lifetime prediction method for MEMS gyroscope based on accelerated degradation test and acceleration factor model
More details
Hide details
Laboratory of Science and Technology on Integrated Logistics Support College of Intelligence Science and Technology National University of Defense Technology Yanwachi str., Changsha, 410073, Hunan, China
College of Intelligence Science and Technology National University of Defense Technology Yanwachi str., Changsha, 410073, Hunan, China
Publication date: 2020-06-30
Eksploatacja i Niezawodność – Maintenance and Reliability 2020;22(2):221-231
The reliability analysis of MEMS gyroscope under long-term operating condition has become an urgent requirement with the enlargement of its application scope and the requirement of good durability. In this study we propose a lifetime prediction method for MEMS gyroscope based on accelerated degradation tests (ADTs) and acceleration factor model. Firstly, the degradation characteristic (bias instability) is extracted based on Allan variance. The effect of temperature stress on the degradation rate of bias instability is analyzed, and it shows that the degradation rate of bias instability would increase with the increase of the temperature. Secondly, the ADTs of MEMS gyroscope are designed and conducted, the degradation model of MEMS gyroscope is established based on the output voltage of MEMS gyroscope and Allan variance. Finally, the acceleration factor model of MEMS gyroscope under temperature stress is derived, and the lifetime of the MEMS gyroscope is predicted based on two group tests data under high stress level. The results show that the lifetime calculated by the acceleration factor model and mean lifetime under high stress levels is close to the mean lifetime calculated by the linear equation at normal temperature stress.
Analog devices, ADXRS300 Data sheet, 2004. -files/data_sheets/ADXRS300.pdf.
Analog devices, ADXRS646 Data sheet, 2011. /adxrs 450.html.
Analog devices, ADXRS646 Data sheet, 2012. adxrs646.html#product-overview.
Chateauneuf, and Alaa. Accelerated life testing and degradation modeling. Reliability Engineering System Safety 2014; 131: 228,
Chen Wenhua, Liu Juan, Gao Liang, et al. Accelerated degradation reliability modeling and test data statistical analysis of aerospace electrical connector. Chinese Journal of Mechanical Engineering 2011; 24(6): 957-962, https://doi.10.3901/ CJME2011.06.957.
Chien-Yu Peng and Sheng-Tsaing Tseng. Progressive-stress accelerated degradation test for highly-reliable products. IEEE Transactions on Reliability 2010; 59(1):30-37, https://doi. 10.1109/TR.2010.2040769.
Chikovani V V, Kyiv, Ukraine. Performance parameters comparison of ring laser, coriolis vibratory and fiber-optic gyros based on Allan variance analysis. IEEE 2nd International Conference Actual Problems of Unmanned Air Vehicles Developments. Proceedings 2013; 153-156,
Chun-Lin Lu, Meng-Kao Yeh. Thermal stress analysis for a CMOS-MEMS microphone with various metallization and materials. Microelectronic Engineering 2019; 213: 47–54,
El-Sheimy N, Hou H, Niu X, et al. Analysis and modeling of inertial sensors using allan variance. IEEE Transactions on instrumentation and measurement 2007; 57(1): 140-149,
Fu-Kwun Wang, Tao-Peng Chu. Lifetime predictions of LED-based light bars by accelerated degradation test. Microelectronics Reliability 2012; 52(7):1332–1336, https://doi. 10.1016/j.microrel.2012.02.019.
Grantham B E, Bailey M A. A least-squares normalized error regression algorithm with application to the Allan variance noise analysis method, In: Proceedings of IEEE/ION PLANS 2006; 750-755,
Heera Mallik M, Divya Jyothi K, Mithun S Varma, Divya Rao A. Agrawal. Minimum Variance Optimal Filter Design for a 3x3 MEMS Gyroscope Cluster Configuration. IFAC 2016; 49.1: 639-645,
Jacopo Iannacci. Reliability of MEMS: A perspective on failure mechanisms, improvement solutions and best practices at development level. Displays 2015; 37: 62-71,
Jianbin Su, Dingbang Xiao, Xiong Wang, Zhihua Chen, Xuezhong Wu. Vibration sensitivity analysis of the ‘Butterfly-gyro’ structure. Microsystem Technologies 2014; 20: 1281-1290,
Jin-Won Joo and Sung-Hoon Choa. Deformation behavior of MEMS gyroscope sensor package subjected to temperature change. IEEE Transactions on Components and Packaging Technologies 2007; 30.2: 346-354, T.2007.897948.
Kim D, Thomas R, and Closkey M. Spectral analysis of vibratory gyro noise. IEEE tranc. Sensors 2013; 13(11): 4361-4374,
Kunsong Lin, Yunxia Chen, Dan Xu. Reliability assessment model considering heterogeneous population in a multiple stresses accelerated test. Reliability Engineering System Safety 2017; 165: 134-143, ress.2017.03.013.
Lawrence C N, Darryll J P. Characterization of ring laser gyro performance using the Allan variance method. Journal of Guidance, Control, and Dynamics 1997; 20 (1): 211-214,
Liang Xue, Cheng-Yu Jiang, Hong-Long Chang, Yong Yang, Wei Qin, Wei-Zheng Yuan. A novel Kalman filter for combining outputs of MEMS gyroscope array. Measurement 2012; 45: 745-754,
Lu X, Chen X, Wang Y, Tan Y. Consistency analysis of degradation mechanism in step-stress accelerated degradation testing. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2017; 19 (2): 302-309, /ein.2017.2.19.
Miroslav Matejček, Mikulaš Šostronek. New Experience with Allan Variance Noise analysis of accelerometers. October 2017;
Mulloni V, Lorenzelli L, Margesin B, Barbato M, Meneghesso G. Temperature as an accelerating factor for lifetime estimation of RF-MEMS switches. Microelectronic Engineering, 2016; 160: 63-67, 10.1016/j.mee.2016.03.023.
Nelson W, Accelerated testing: statistical models, test plans, and data analysis. John Wiley & Sons: New York, 1990; NY. 10.1002/9780470316795.
Ningfang S, Yuan R, Jin J. Autonomous estimation of Allan variance coefficients of onboard fiber optic gyro. Journal of Instrumentation 2011; 6.09: P09005-P09005,
Oliveira V R B, Colosimo E A. Comparison of methods to estimate the time-to-failure distribution in degradation tests. Quality Reliability Engineering International 2004; 20(4): 363-73,
Pin Lv, Jianye Liu, Jizhou Lai, Kai Huang. Allan variance method for gyro noise analysis using weighted least square algorithm. Optik 2015; 126: 2529-2534,
ReliaSoft Co. Accelerated Life Testing Reference. Tucson, AZ: ReliaSoft Publishing, 2014,
Richard J V, Ahmed S K. Statistical modeling of rate gyros. IEEE Transactions on Instrumentation and Measurement 2012; 61: 673-684,
Saeedivahdat A, Abdolkarimzadeh F, Feyzi A, Rezazadeh G, Tarverdilo S. Effect of thermal stresses on stability and frequency response of a capacitive microphone. Microelectronics Journal 2010; 41: 865-873.
Si X S, Wang W B, Hu C H, Zhou D H, Pecht M G. Remaining useful life estimation based on a nonlinear diffusion degradation process. IEEE Transactions on Reliability 2012; 61(1): 50-67,
Songhua Hao, Jun Yang, Christophe Berenguer. Nonlinear step-stress accelerated degradation modeling considering three sources of variability. Reliability Engineering System Safety 2018; 172: 207-215,
Tabata O, Tsuchiya T. Reliability of MEMS: testing of materials and devices. Weinheim, Wiley, 2006,
Wang YS, Fang X, Zhang CH, Chen X, Lu JZ. Lifetime prediction of self-lubricating spherical plain bearings based on physics-of-failure model and accelerated degradation test. Eksploatacja i Niezawodnosc - Maintenance and Reliability 2016; 18(4): 528-538,
Wang Y, Zhang C, Chen X, Tan Y. Lifetime prediction method for electron multiplier based on accelerated degradation test. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2014; 16 (3): 484-490.
Yang Z, Chen Y X, Li X F, Zio E, and Kang R. Smart electricity meter reliability prediction based on accelerated degradation testing and modeling. Electrical Power and Energy Systems 2014; 56: 209-219,
Zhiqiang X and Gebre-Egziabher D. Modeling and bounding low inertial sensor errors. In proc. IEEE/ION Position, Location and Navigation Symposium 2008: 1122-1132,
Reliability assessment of PEEK/17-4PH stainless steel tribopair under seawater lubrication
Songlin Nie, Yixuan Song, Zhonghai Ma, Fanglong Yin, Hui Ji
Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability
Reliability assessment for micro inertial measurement unit based on accelerated degradation data and copula theory
Bingjia Chi, Yashun Wang, Jingwen Hu, Shufeng Zhang, Xun Chen
Eksploatacja i Niezawodnosc - Maintenance and Reliability
Long-term Reliability Evaluation of Internal Atmosphere on Sealed Packaged MEMS Devices
Xinlong Huang, Xianshan Dong, Bin Zhou, Canxiong Lai, Yanlong Fu, Youwang Hu
2022 23rd International Conference on Electronic Packaging Technology (ICEPT)
Long-Term Degradation Evaluation of the Mismatch of Sensitive Capacitance in MEMS Accelerometers
Xinlong Huang, Xianshan Dong, Guizhen Du, Youwang Hu
Advances in Guidance, Navigation and Control
Zhiyong Miao, Bing Li, Tao Guo, Yi Chen
Stress evolution mechanism and thermo-mechanical reliability analysis of copper-filled TSV interposer
Yuan Chen, Wei Su, Hong-Zhong Huang, Ping Lai, Xiao-ling Lin, Si Chen
Eksploatacja i Niezawodność – Maintenance and Reliability
Cyclic stress accelerated life test method for mechatronic products
Yashun Wang, Jingwen Hu, Shufeng Zhang, Xun Chen
Quality and Reliability Engineering International
A Faster Evaluation Method of Product Acceleration Factors Based on a Reliability Model
Xiaoyu Li
2024 IEEE 7th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)
Journals System - logo
Scroll to top