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Lifetime prediction method for MEMS gyroscope based on accelerated degradation test and acceleration factor model
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Laboratory of Science and Technology on Integrated Logistics Support College of Intelligence Science and Technology National University of Defense Technology Yanwachi str., Changsha, 410073, Hunan, China
College of Intelligence Science and Technology National University of Defense Technology Yanwachi str., Changsha, 410073, Hunan, China
Publication date: 2020-06-30
Eksploatacja i Niezawodność – Maintenance and Reliability 2020;22(2):221–231
The reliability analysis of MEMS gyroscope under long-term operating condition has become an urgent requirement with the enlargement of its application scope and the requirement of good durability. In this study we propose a lifetime prediction method for MEMS gyroscope based on accelerated degradation tests (ADTs) and acceleration factor model. Firstly, the degradation characteristic (bias instability) is extracted based on Allan variance. The effect of temperature stress on the degradation rate of bias instability is analyzed, and it shows that the degradation rate of bias instability would increase with the increase of the temperature. Secondly, the ADTs of MEMS gyroscope are designed and conducted, the degradation model of MEMS gyroscope is established based on the output voltage of MEMS gyroscope and Allan variance. Finally, the acceleration factor model of MEMS gyroscope under temperature stress is derived, and the lifetime of the MEMS gyroscope is predicted based on two group tests data under high stress level. The results show that the lifetime calculated by the acceleration factor model and mean lifetime under high stress levels is close to the mean lifetime calculated by the linear equation at normal temperature stress.
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