RESEARCH PAPER
An approach in determining the critical level of degradation based on results of accelerated test
1
University of Defence, Faculty of Military Technology, Kounicova 65, 66210, Brno, Czech Republic
2
Lublin University of Technology, Mechanical Engineering Faculty, ul. Nadbystrzycka 36, 20-618 Lublin, Poland
Publication date: 2022-06-30
Eksploatacja i Niezawodność – Maintenance and Reliability 2022;24(2):330-337
HIGHLIGHTS
- Degradation measurement of LEDs in the frame of accelerated tests.
- Method for determination of the degradation threshold based on the failure data.
- Determination of degradation threshold using classical approach.
- Determination of degradation threshold using Wiener Process-based model.
KEYWORDS
ABSTRACT
Nowadays, systems are more complex and require high reliability for their components, especially critical system components. Therefore, to avoid serious damage, system are often replaced before the actual failure. The replaced parts are considered to have “soft failure”, and the limit in which the parts are replaced is known as the critical level of the degradation process. Determining the appropriate value of the critical level for a product is an important problem in their exploitation, as well as for predicting the Mean Time to Failure (MTTF) or Remaining Useful Lifetime (RUL) of this product based on the degradation data by the mathematical models. In this article, an approach in determining the critical levels based on failure data from an accelerated test is introduced. This approach is applied with the degradation process of Light-Emitting Diodes (LED) in an accelerated test and a type of Wiener process-based model is used to predict the MTTF or RUL of LED based on their degradation data and the found critical level.
REFERENCES (21)
1.
Deng Y, Barros A, Grall A. Calculation of failure level based on inverse first passage problem. Annual Reliability and Maintainability Symposium (RAMS) 2014; 1-6, https://doi.org/10.1109/RAMS.2....
2.
Dong QL, Cui, LR. A study on stochastic degradation process models under different types of failure Thresholds. Reliability Engineering & System Safety 2019; 181: 202-212, https://doi.org/10.1016/j.ress....
3.
Fan L, Wang K, Fan D. A combined universal generating function and physics of failure Reliability Prediction Method for an LED driver. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2021; 23 (1): 74–83, http://dx.doi.org/10.17531/ein....
4.
Gamiz ML, et al. Applied nonparametric statistics in reliability. London: Springer-Verlag 2011, https://doi.org/10.1007/978-0-....
5.
Gao, Z, et al. A Wiener process-based remaining life prediction method for light-emitting diode driving power in rail vehicle carriage. Advances in Mechanical Engineering 2019; 11(3): 1-8, https://doi.org/10.1177/168781....
6.
Ibrahim MS, et al. System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method. Measurement 2021; 176: 109191, https://doi.org/10.1016/j.meas....
7.
Illuminating Engineering Society. IES LM-80-08 Approved method: Measuring lumen maintenance of LED light sources. New York: IES 2008, ISBN 978-0-87995-227-3.
8.
International Electrotechnical Commission. IEC 60605-4 Equipment reliability testing - Part 4: Statistical procedures for exponential distribution – Point estimates, confidence intervals, prediction intervals and tolerance intervals. Geneva: IEC 2001.
9.
Kang J, et al. Remaining useful life prediction of cylinder liner based on nonlinear degradation model. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2022; 24 (1): 62–69, http://doi.org/10.17531/ein.20....
10.
Li J, Wang Z, Liu C, Qiu M. Accelerated degradation analysis based on a random-effect Wiener process with one-order autoregressive errors. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2019; 21 (2): 246–255, http://dx.doi.org/10.17531/ein....
11.
Palayangoda LK, et al. Evaluation of mean-time-to-failure based on nonlinear degradation data with applications. IISE Transactions 2022; 54(3): 286-302, https://doi.org/10.1080/247258....
12.
Pourhassan MR, Raissi S, Hafezalkotob A. A simulation approach on reliability assessment of complex system subject to stochastic degradation and random shock. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2020; 22 (2): 370–379, http://dx.doi.org/10.17531/ein....
13.
Vintr Z, Hoang, AD. Accelerated Reliability Testing of Combat Vehicles Electronic Parts Based on Multifactor Stress. Proceedings of the 31st European Safety and Reliability Conference 2021; 2804-2809. https://doi.org/10.3850/978-98....
14.
Wang C, Hu Q, Yu D. Reliability Evaluation under Accelerated Degradation Testing with Recovery Capability Considered. Annual Reliability and Maintainability Symposium (RAMS) 2019; 1-5. https://doi.org/10.1109/RAMS.2....
15.
Wang ZF, Huang Z, Liao WC. Degradation analysis on trend gamma process. Quality and Reliability Engineering International 2022; 38(2):941-956, https://doi.org/10.1002/qre.30....
16.
Yap BW, Sim CH. Comparisons of various types of normality tests. Journal of Statistical Computation and Simulation 2011; 81(12): 2141- 2155, https://doi.org/10.1080/009496....
17.
Ye ZS, et al. Degradation data analysis using Wiener processes with measurement errors. IEEE Transactions on Reliability 2013; 62(4): 772-780, https://doi.org/10.1109/TR.201....
18.
Zhang C, et al. Opportunistic maintenance strategy of a Heave Compensation System for expected performance degradation. Eksploatacja i Niezawodnosc – Maintenance and Reliability 2021; 23 (3): 512–521, http://doi.org/10.17531/ein.20....
19.
Zhang Z, Zhou M, Fang M. First-passage probability analysis of Wiener process using different methods and its applications in the evaluation of structural durability degradation. European Journal of Environmental and Civil Engineering 2021; 25(10): 1763-1781, https://doi.or g/10.1080/19648189.2019.1601134.
20.
Zhong W, Walther T. Failure Analysis of Some Commercial Spotlights Based on Light Emitting Diodes. Electronics 2022, 11(1): 48, https://doi.org/10.3390/electr....
21.
Zhou SR, Tang YC, Xu AC. A generalized Wiener process with dependent degradation rate and volatility and time-varying mean-to-variance ratio. Reliability Engineering & System Safety 2021; 216: 107895, http://doi.org/10.1016/j.ress.....
CITATIONS (3):
1.
Cyclic stress accelerated life test method for mechatronic products
Yashun Wang, Jingwen Hu, Shufeng Zhang, Xun Chen
Quality and Reliability Engineering International
Yashun Wang, Jingwen Hu, Shufeng Zhang, Xun Chen
Quality and Reliability Engineering International
2.
Combustion Engine Degradation Assessment Supported by Tribological Data, Correlation and Reduction Analysis
D. Valis, L. Zak, I Z. Vintr
2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
D. Valis, L. Zak, I Z. Vintr
2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
3.
Light emitting diode degradation and failure occurrence modelling based on accelerated life test
David Vališ, Marie Forbelská, Zdeněk Vintr, Quoc Tiep La, Zdeněk Kohl
Engineering Failure Analysis
David Vališ, Marie Forbelská, Zdeněk Vintr, Quoc Tiep La, Zdeněk Kohl
Engineering Failure Analysis
Share
RELATED ARTICLE
| eISSN: | 2956-3860 |
| ISSN: | 1507-2711 |
We process personal data collected when visiting the website. The function of obtaining information about users and their behavior is carried out by voluntarily entered information in forms and saving cookies in end devices. Data, including cookies, are used to provide services, improve the user experience and to analyze the traffic in accordance with the Privacy policy. Data are also collected and processed by Google Analytics tool (more).
You can change cookies settings in your browser. Restricted use of cookies in the browser configuration may affect some functionalities of the website.
You can change cookies settings in your browser. Restricted use of cookies in the browser configuration may affect some functionalities of the website.
